Deflection due to planar channeling and volume reflection in short bent silicon crystals was observed for the first time for 150 GeV/c negative particles, pi(-) mesons, at one of the secondary beams of the CERN SPS. The deflection efficiency was about 30% for channeling and higher than 80% for volume reflection. Volume reflection occurs, in spite of the attractive character of the forces acting between the particles and the crystal planes, in a wide angular range of the crystal orientations determined by the crystal bend angle.
Observation of channeling and volume reflection in bent crystals for high-energy negative particles
PREST, MICHELA;
2009-01-01
Abstract
Deflection due to planar channeling and volume reflection in short bent silicon crystals was observed for the first time for 150 GeV/c negative particles, pi(-) mesons, at one of the secondary beams of the CERN SPS. The deflection efficiency was about 30% for channeling and higher than 80% for volume reflection. Volume reflection occurs, in spite of the attractive character of the forces acting between the particles and the crystal planes, in a wide angular range of the crystal orientations determined by the crystal bend angle.File | Dimensione | Formato | |
---|---|---|---|
1-s2.0-S0370269309011952-main.pdf
accesso aperto
Descrizione: PDF editoriale
Tipologia:
Altro materiale allegato
Licenza:
Creative commons
Dimensione
238.12 kB
Formato
Adobe PDF
|
238.12 kB | Adobe PDF | Visualizza/Apri |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.