The after-pulsing probability in Silicon Photomultipliers and its time constant are obtained measuring the mean number of photo-electrons in a variable time window following a light pulse. The method, experimentally simple and statistically robust due to the use of the Central Limit Theorem, has been qualified applying it to an HAMAMATSU Multi Pixel Photon Counter (MPPC) S10362-11-100C.

A simple and robust method to study after-pulses in Silicon Photomultipliers

CACCIA, MASSIMO;SANTORO, ROMUALDO;
2014-01-01

Abstract

The after-pulsing probability in Silicon Photomultipliers and its time constant are obtained measuring the mean number of photo-electrons in a variable time window following a light pulse. The method, experimentally simple and statistically robust due to the use of the Central Limit Theorem, has been qualified applying it to an HAMAMATSU Multi Pixel Photon Counter (MPPC) S10362-11-100C.
2014
Analysis and statistical methods; Avalanche-induced secondary effects; Photon detectors for UV, visible and IR photons (solid-state) (PIN diodes, APDs, Si-PMTs, G-APDs, CCDs, EBCCDs, EMCCDs
Caccia, Massimo; Santoro, Romualdo; Stanizzi, G. A.
File in questo prodotto:
File Dimensione Formato  
JINST_AfterPulse.pdf

accesso aperto

Tipologia: Documento in Post-print
Licenza: DRM non definito
Dimensione 231.94 kB
Formato Adobe PDF
231.94 kB Adobe PDF Visualizza/Apri

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11383/1966722
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 1
  • ???jsp.display-item.citation.isi??? 1
social impact