We observed reduction of multiple Coulomb scattering of 855 MeV electrons within a Si crystalline plate w.r.t. an amorphous plate with the same mass thickness. The reduction owed to complete or partial suppression of the coherent part of multiple scattering in a crystal vs crystal orientation with the beam. Experimental data were collected at Mainz Mikrotron and critically compared to theoretical predictions and Monte Carlo simulations. Our results highlighted maximal 7% reduction of the r.m.s. scattering angle at certain beam alignment with the  crystal axes. However, partial reduction was recorded over a wide range of alignment of the electron beam with the crystal up to 15∘. This evidence may be relevant to refine the modelling of multiple scattering in crystals for currently used software, which is interesting for detectors in nuclear, medical, high energy physics.
|Data di pubblicazione:||2020|
|Titolo:||Broad angular anisotropy of multiple scattering in a Si crystal|
|Rivista:||THE EUROPEAN PHYSICAL JOURNAL. C, PARTICLES AND FIELDS|
|Digital Object Identifier (DOI):||10.1140/epjc/s10052-019-7586-6|
|Codice identificativo ISI:||WOS:000521222100002|
|Codice identificativo Scopus:||2-s2.0-85078333173|
|Appare nelle tipologie:||Articolo su Rivista|