A wavelength shift of 15 nm is obtained for near-infrared (1250 nm) pulses interacting with a temporally engineered Al-doped-ZnO layer. The underlying time-refraction process is driven by an intense, <100 fs pulse at 785 nm.
Doppler-Shift Emulation Using Highly Time-Refracting TCO Layer
Clerici M.;Faccio D.;
2016-01-01
Abstract
A wavelength shift of 15 nm is obtained for near-infrared (1250 nm) pulses interacting with a temporally engineered Al-doped-ZnO layer. The underlying time-refraction process is driven by an intense, <100 fs pulse at 785 nm.
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